Cart (Loading....) | Create Account
Close category search window
 

Forward and reverse recovery spice model of a JBS silicon carbide diode

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Giesselmann, M. ; ECE, Texas Tech. Univ., Lubbock, TX ; Edwards, R. ; Bayne, S. ; Kaplan, S.
more authors

The charged controlled model is presented as an effective method to simulate junction barrier schottky (JBS) silicon carbide diodes. Proven as a valuable approach for silicon devices, this model can also account for wide bandgap energy semiconductors. The model was implemented in Oread's SPICE software package using analog behavioral modelling. The simulation combines the efficiency of a traditional static model with an improved charge controlled model representing transient characteristics of the semiconductor due to stored charge in the depletion layer. The result is an enhanced model that simulates in short period of time. Parameter extraction methods are used to help identify saturation currents, capacitance, resistance, voltages, and modelling coefficients. The simulation results in a close fit to the data taken during reverse recovery of a JBS SiC diode

Published in:

Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop. Conference Record of the Twenty-Sixth International

Date of Conference:

23-26 May 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.