Cart (Loading....) | Create Account
Close category search window
 

Polynomial-time metrics for attributed trees

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Torsello, A. ; Dipartimento di Informatica, Universita Ca Foscari di Venezia, Venezia Mestre, Italy ; Hidovic-Rowe, D. ; Pelillo, M.

We address the problem of comparing attributed trees and propose four novel distance measures centered around the notion of a maximal similarity common subtree. The proposed measures are general and defined on trees endowed with either symbolic or continuous-valued attributes and can be applied to rooted as well as unrooted trees. We prove that our measures satisfy the metric constraints and provide a polynomial-time algorithm to compute them. This is a remarkable and attractive property, since the computation of traditional edit-distance-based metrics is, in general, NP-complete, at least in the unordered case. We experimentally validate the usefulness of our metrics on shape matching tasks and compare them with (an approximation of) edit-distance.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:27 ,  Issue: 7 )

Date of Publication:

July 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.