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Reduction of power and test time by removing cluster of don't-care from test data set

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3 Author(s)

Reduction of power dissipation and test time is accomplished by forming two clusters of don't-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.

Published in:

VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on

Date of Conference:

11-12 May 2005