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Finite element method for the accurate analysis of delay line propagation characteristics

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2 Author(s)
Topsakal, E. ; Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA ; Volakis, J.

The finite element method (FEM) with tetrahedral elements has been applied to a meander delay line problem for determining propagation characteristics. S11 at the input port and the field variation right above the delay line are calculated and compared with reference data. The effects of meander line spacing and meander line length on the output voltage are also investigated. Results are obtained for various dielectric substrates having different thicknesses.

Published in:

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on  (Volume:2 )

Date of Conference:

11-16 May 2003

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