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Behavioral EMI models of complex digital VLSI circuits

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3 Author(s)
Steinecke, T. ; Infineon Technol. AG, Muenchen, Germany ; Koehne, H. ; Schmidt, M.

Increasing EMI potential of high-performance digital circuits like 32-bit microcontrollers demand for switching current models and feasible ways to run netlist-based EMI simulations. A promising modeling approach for digital VLSI circuits is presented and a silicon test vehicle for the correlation between models and measurements is described.

Published in:

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on  (Volume:2 )

Date of Conference:

11-16 May 2003