Cart (Loading....) | Create Account
Close category search window
 

An improved numerical approach to Sommerfeld integrals in half lossy space by using complex image method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Bo Zhang ; Dept. of Electr. Eng., North China Electr. Power Univ., Hebei, China ; Xiang Cui ; Zhibin Zhao ; Haoliu Yin
more authors

How to obtain the results of the time-consuming Sommerfeld integrals in multiplayer media quickly is very important to the EMC problems such as lighting, grounding and PCB design. In this paper, an improved method based on the complex image approach is developed to calculate the Sommerfeld integrals. A self-adaptation method to find a suitable sampling is presented. Generalized pencil-of-function method is used to obtain the complex images. With the method, the value of Green's function in half lossy space can be obtained quickly and accurately. The computational results are in good agreement with those obtained by numerical integral method.

Published in:

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on  (Volume:2 )

Date of Conference:

11-16 May 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.