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We present a new low-frequency noise model of a GaInP-GaAs HBT and the associated extraction process from measurements. Specific measurements enable us to locate the two dominant low-frequency noise sources. Their spectral densities extraction as a function of the emitter bias current is then performed and a normalized scalable model is deduced. The cyclostationarity of the low-frequency noise sources is justified. The whole noise model including the shot noise source is implemented in the nonlinear HBT model used in the United Monolithic Semiconductors foundry. In order to verify the validity of the scalable noise model, several voltage-controlled oscillators with different center frequencies and tuning bandwidth have been designed and processed. Comparisons between the predicted performances and experimental results show an excellent agreement and validate the proposed low-frequency noise modeling of multifinger HBTs.