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On-chip microwave test circuits for production IC measurements

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5 Author(s)
Eisenstadt, W.R. ; Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA ; Fox, R.M. ; Qizhang Yin ; Yoon, J.-S.
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The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).

Published in:

ARFTG Microwave Measurements Conference, Fall 2004. 64th

Date of Conference:

2-3 Dec. 2004