Cart (Loading....) | Create Account
Close category search window
 

Large signal network analyzer with trigger for baseband & RF system characterization with application to K-modeling & output baseband modulation linearization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Suk Keun Myoung ; Ohio State Univ., Columbus, OH, USA ; Xian Cui ; Chaillot, D. ; Roblin, P.
more authors

The modeling and balancing of IQ modulators and the development of linearization techniques for power amplifiers (PA) such as output baseband modulation (OBM) benefit from the availability of linear and nonlinear MIMO Volterra system parameters involving both baseband and RF signals. A triggered LSNA system is reported for this purpose. By synchronizing the LSNA measurements with the generation of the baseband modulation, RF signals with a stable envelope can be acquired. Applied to an IQ modulator the triggered LSNA facilitates the measurement of the correlation between the I and Q signals at baseband and RF, effectively yielding the modulator K-model. Inverting the K-model of the IQ modulator, an IQ balancing of about 43 dBc and 46 dBc for the lower and upper side-bands, respectively, was achieved using 14 bit signed DACs. Finally the triggered LSNA finds applications in the linearization of RF PAs with input (IBM) or output (OBM) baseband modulation by facilitating the extraction of the Ymd- and Ymd+ Volterra nonlinear parameters.

Published in:

ARFTG Microwave Measurements Conference, Fall 2004. 64th

Date of Conference:

2-3 Dec. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.