By Topic

Computer simulation as an effective technique in metrology and statistical product quality control

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

The capabilities of computer simulation methods have been shown for the investigation of probabilistic regularities and the development of mathematical and applied statistic tools used in problems of statistical quality corttrol and analysis of rucasuring results.

Published in:

Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of

Date of Conference:

21-24 Sept. 2004