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A testable design of logic circuits under highly observable condition

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2 Author(s)
W. Xiaoqing ; Dept. of Appl. Phys., Osaka Univ., Japan ; K. Kinoshita

The concept of k-UCP circuits is proposed. In a k-UCP circuit, all stuck-at faults and stuck-open faults can be detected and located by k+1 and k(k+1)+1 tests, respectively, under the highly observable condition. A method of modifying an arbitrary combinational circuit into a k-UCP circuit is also proposed

Published in:

IEEE Transactions on Computers  (Volume:41 ,  Issue: 5 )