By Topic

Temperature resistant IR-gas sensor for CO2 and H2O

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Baschant, D. ; M+R Mess und Regelungstechnik GmbH, Kothen, Germany ; Stahl, H.

Designing a high temperature resistant IR-gas sensor for CO2 and water vapor one has to consider the differences in the specific absorbances, spacings between the heated parts and optics/electronics, emission spectrum of cost-saving radiators and high humidity in the measuring gas. Using HITRAN database a sensor model was developed. Water vapor can be measured selectively at 1.85 μm with a chamber length of 20 cm. So CO2 has to be measured at low wavelengths too. In the range of 2.7 μm CO2 absorbs sufficiently but a water absorption is to be considered. The model shows that the CO2 absorption reaches a maximum in the range from 2.7 μm to 2.75 μm with a decreasing water absorption with increasing wavelengths. After finishing the sensor the model was checked with the actual filter curves. The results show a good analogy between model data and measurements and the benefit of modeling in the design of IR-gas sensors. The analyze of cross sensitivity shows strong overlapping bands and a multiplicative influence of water absorption to the CO2 signal. After correction of the absorption signal of 2.7 μm-channel with the absorption signal of the 1.85 μm-channel the cross sensitivity to water vapor was limited to <3% of CO2 measuring range.

Published in:

Sensors, 2004. Proceedings of IEEE

Date of Conference:

24-27 Oct. 2004