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Circuits and techniques for high-resolution measurement of on-chip power supply noise

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3 Author(s)
E. Alon ; Dept. of Electr. Eng., Stanford Univ., CA, USA ; V. Stojanovic ; M. A. Horowitz

This paper presents a technique for characterizing the statistical properties and spectrum of power supply noise using only two on-chip low-throughput samplers. The samplers utilize a voltage-controlled oscillator to perform high-resolution analog-to-digital conversion with minimal hardware. The measurement system is implemented in a 0.13-μm process along with a high-speed link transceiver. Measured results from this chip validate the accuracy of the measurement system and elucidate several aspects of power supply noise, including its cyclostationary nature.

Published in:

IEEE Journal of Solid-State Circuits  (Volume:40 ,  Issue: 4 )