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A built-in technique for probing power supply and ground noise distribution within large-scale digital integrated circuits

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3 Author(s)
M. Nagata ; Dept. of Comput. & Syst. Eng., Kobe Univ., Japan ; T. Okumoto ; K. Taki

Design of noise detector circuits as compact as standard logic cells is proposed. High-density large-scale digital integrated circuits that embed such built-in noise detectors enable in-depth characterization of dynamic power supply and ground noises. Dependence of power supply and ground voltage drops on the location of active cell rows within 1.8-V standard cell-based digital circuits are consistently measured by 1.8- and 2.5-V built-in detectors fabricated in a 0.18-μm CMOS triple-well technology. Measurements also show that ground noise distribution is distinctively more localized than power supply counterparts due to the presence of a substrate.

Published in:

IEEE Journal of Solid-State Circuits  (Volume:40 ,  Issue: 4 )