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Threshold voltage shift compensated active pixel sensor array for digital X-ray imaging in a-Si technology

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4 Author(s)
Safavian, N. ; Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Ont., Canada ; Lai, J. ; Rowlands, J. ; Nathan, A.

A new active pixel sensor for X-ray digital imaging using amorphous silicon thin-film transistors (a-Si TFTs) is proposed. Simulation results show that this new APS structure is fully capable of compensating for variations in threshold voltage (VT) of a-Si TFTs under prolonged gate voltage stress.

Published in:

Electronics Letters  (Volume:41 ,  Issue: 7 )