Cart (Loading....) | Create Account
Close category search window

A Maintenance-Oriented Fault Model for the DECOS Integrated Diagnostic Architecture

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Peti, P. ; Vienna Univ. of Technol., Austria ; Obermaisser, R. ; Ademaj, A. ; Kopetz, H.

The increasing use of electronics in the automotive and avionic domain has lead to dramatic improvements with respect to functionality, safety, and cost. However, with this growth of electronics the likelihood of failures due to faults originating from electronic equipment also increases. In order to tackle prevalent diagnostic problems such as the reduction of the fault-not-found ratio, a maintenance-oriented fault model is needed that serves as the basis for the classification of experienced failures. In this paper we introduce such a maintenance-oriented fault model that establishes the conceptual foundation of the diagnostic services of the DECOS integrated architecture. The fault model takes the component-based nature of today's distributed embedded systems into account. According to this model each experienced failure is classified according to the field replaceable units of the system.

Published in:

Parallel and Distributed Processing Symposium, 2005. Proceedings. 19th IEEE International

Date of Conference:

04-08 April 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.