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Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:52 Issue:1 Help

Validity of using a fixed analog input for evaluating the SEU sensitivity of a flash analog-to-digital converter

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6 Author(s)
Buchner, S. ; QSS Group Inc., Greenbelt, MD, USA ; Campbell, A.B. ; Sternberg, A. ; Massengill, L.
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The single-event upset (SEU) rate in a flash analog-to-digital converter (ADC) AD9058 on board a space experiment varied by more than an order of magnitude, depending on the input. A pulsed laser aided in elucidating the reasons, which were found to be the result of the unique design of the AD9058.

Published in:
Nuclear Science, IEEE Transactions on  (Volume:52 ,  Issue: 1 )

Date of Publication: Feb. 2005

Page(s):
462 - 467
ISSN :
0018-9499
INSPEC Accession Number:
8375622
Digital Object Identifier :
10.1109/TNS.2004.842721
Product Type:
Journals & Magazines
Date of Current Version :
11 April 2005
Issue Date :
Feb. 2005
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

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