Close category search window
 

Semi-blind channel estimation and data detection for OFDM systems over frequency-selective fading channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tao Cui ; Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, Alta., Canada ; Tellambura, C.

This paper considers semi-blind channel estimation and data detection for OFDM systems over frequency-selective fading channels. Using the maximum likelihood (ML) principle, we derive a blind channel estimator by taking the time domain transmitted signal as Gaussian (due to the central limit theorem) and averaging the likelihood function over the resulting Gaussian distribution. This estimator is realized using the steepest descent algorithm. Similarly, our semi-blind data detector integrates the channel impulse response (CIR) out of the likelihood function, which is realized using sphere decoding and V-BLAST. Simulation results show that our proposed channel estimator and data detector perform a fraction of dB within an ideal reference receiver.

Published in:
Acoustics, Speech, and Signal Processing, 2005. Proceedings. (ICASSP '05). IEEE International Conference on  (Volume:3 )

Date of Conference: 18-23 March 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.