Cart (Loading....) | Create Account
Close category search window
 

The variation of spectral response of transmission-type GaAs photocathode in the seal process

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Liu Lei ; Sch. of Electron. Eng. & Optoelectronic Technol., Nanjing Univ. of Sci. & Technol., China ; Chang Benkang ; Du Yujie ; Qian Yunsheng
more authors

Transmission-type GaAs photocathode are emerging from the laboratory as practical photo-sensing devices with vastly improved sensitivity and spectral range compared with other photocathode. It is widely used in the many fields such as semiconductor device, optical radiation measurement, camera device and low-level-light night vision. Measurement of parameters of photocathode, especially its spectral response, is of great importance on the technique of photocathode's performance. During the fabrication of photocathode, the technology of online spectral response measurement enables us to determine spectral response quickly and accurately. Through analyzing and comparing those measured response curves, much information about photocathodes, for example, the sensitivity, the photo-electron surface escape probability, the thickness of the active layer, the diffusion length of electrons and the back interface recombination velocity of electrons can be obtained which is useful in both the research and the fabrication of photocathodes (Zhiyuan Zhong and BenKang Chang, 1998; Andre et al, 1981).

Published in:

Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International

Date of Conference:

6-10 Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.