Cart (Loading....) | Create Account
Close category search window

Effects of process and product parameters on the shape of nanosecond pulses used in high-field liquid food treatment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Jayaram, S.H. ; Electr. & Comput. Eng. Dept., Univ. of Waterloo, Ont., Canada ; El-Hag, A.H. ; Espino-Cortes, F.P. ; Wong, R.J.
more authors

Many industrial applications like high-field food sterilization require short-duration fast-rise-time high-voltage pulses. Measurement of such narrow steep-front high-voltage pulses are always difficult, considering the potential levels and the time scales involved. In addition, by nature, liquid foods are highly conductive, hence, any small change in circuit inductance has substantial influence on the measured pulse. Further, the oscillations introduced by the circuit parameters influence the voltage magnitude and the effective treatment time. Hence, these points must be taken into account while computing the total treatment time and the energy actually spent, as these parameters influence the kinetics of food processing. In this paper, the effects of load impedance, the circuit inductance, and the location of the probe position that influence the shape of the measured pulse with liquid foods as load are discussed. It has also been shown that knowing the low-voltage conductivity of the food to be treated, and with a realistic estimation of circuit inductance, it is possible to predict the shape of the pulse under different test conditions using PSPICE circuit models.

Published in:

Industry Applications, IEEE Transactions on  (Volume:41 ,  Issue: 2 )

Date of Publication:

March-April 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.