Close category search window
 

Travelling wave based fault location for teed circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Evrenosoglu, C.Y. ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; Abur, A.

This paper describes a fault location algorithm for three terminal lines using wavelet transform of the fault initiated transients. The results presented in are extended to the case of three terminal configuration and a new single ended procedure is developed for teed circuits. The algorithm gives accurate results for the case of three terminal lines including series compensated branch, mutual coupled line section and different values of fault resistances. The performance of the algorithm is tested on different scenarios by using ATP/EMTP program and MATLAB Wavelet Toolbox.

Published in:
Power Delivery, IEEE Transactions on  (Volume:20 ,  Issue: 2 )

Date of Publication: April 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.