Cart (Loading....) | Create Account
Close category search window

Error analysis in static harmonic State estimation: a statistical approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yu, K.K.C. ; Univ. of Canterbury, Christchurch, New Zealand ; Watson, N.R. ; Arrillaga, J.

The effectiveness of harmonic state estimation (HSE) in identifying the location and magnitude of harmonic sources is largely dependent on the accuracy of the measurements. Measurement errors (or bad data) can be classified into two groups; measurement noise and gross error. This paper uses a statistical approach (cumulative probability density functions) obtained from five thousand Monte Carlos runs to investigate the impact of measurement noise and gross errors in harmonic state estimation. The Lower South Island of the New Zealand system is used as the test system and the results are probability curves containing the statistics of the estimation error. The effect of additional measurements on an over-determined system to filter noise is also discussed.

Published in:

Power Delivery, IEEE Transactions on  (Volume:20 ,  Issue: 2 )

Date of Publication:

April 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.