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Test solution selection using multiple-objective decision models and analyses

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1 Author(s)
Hamling, D.T. ; Teradyne Inc., Poway, CA, USA

Designing new automatic test equipment (ATE) frameworks in alignment with the advances in semiconductor technology remains one of the most difficult challenges in the test community. This article presents an elegant methodology for analyzing different models for ATE operation. The methodology ultimately provides a single figure of merit for evaluation and comparison.

Published in:

Design & Test of Computers, IEEE  (Volume:22 ,  Issue: 2 )

Date of Publication:

March-April 2005

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