IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Biophotonics, 2004. APBP 2004 ... Help

Combining Raman spectroscopy with background near-infrared autofluorescence to improve the noninvasive detection of malignant tumors

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Zhiwei Huang ; British Columbia Cancer Agency, Vancouver, BC, Canada ; Lui, H. ; McLean, D.I. ; Korbelik, M.
more authors

This study evaluated and compared the diagnostic ability of near-infrared (NIR) autofluorescence spectroscopy, NIR Raman spectroscopy, and the superimposed Raman and NIR autofluorescence spectroscopy for in vivo detection of malignant tumors using a murine model.

Published in:
Biophotonics, 2004. APBP 2004. The Second Asian and Pacific Rim Symposium on

Date of Conference: 14-17 Dec. 2004

Page(s):
101 - 102
Print ISBN:
0-7803-8676-0
INSPEC Accession Number:
8435576
Digital Object Identifier :
10.1109/APBP.2004.1412299
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.