Referenced Items are not available for this document.
Transient current (IDD) testing has been often cited and investigated as an alternative and/or supplement to quiescent current (IDDQ) testing. In this correspondence, we present a novel integrated method for fault detection and localization using wavelet transform-based IDD waveform analysis. The time-frequency resolution property of wavelet transform helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on measured data from a fabricated 8-bit shift register, and simulation data from more complex circuits show promising results for both detection and localization. Wavelet-based detection method shows better sensitivity than spectral and time-domain methods. Effectiveness of the localization method in presence of complex power supply network, measurement noise, and process variation is also addressed.
Published in:
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
(Volume:13
,
Issue:
4
)
Date of Publication: April 2005
- Page(s):
- 503 - 507
- ISSN :
- 1063-8210
- INSPEC Accession Number:
- 8368319
- Digital Object Identifier :
- 10.1109/TVLSI.2004.842880
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 04 April 2005
- Issue Date :
- April 2005
- Sponsored by :
- IEEE Circuits and Systems Society
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