Cart (Loading....) | Create Account
Close category search window
 

Effectively mining and using coverage and overlap statistics for data integration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zaiqing Nie ; Microsoft Res. Asia, Beijing, China ; Kambhampati, S. ; Nambiar, U.

Recent work in data integration has shown the importance of statistical information about the coverage and overlap of sources for efficient query processing. Despite this recognition, there are no effective approaches for learning the needed statistics. The key challenge in learning such statistics is keeping the number of needed statistics low enough to have the storage and learning costs manageable. In this paper, we present a set of connected techniques that estimate the coverage and overlap statistics, while keeping the needed statistics tightly under control. Our approach uses a hierarchical classification of the queries and threshold-based variants of familiar data mining techniques to dynamically decide the level of resolution at which to learn the statistics. We describe the details of our method, and, present experimental results demonstrating the efficiency of the learning algorithms and the effectiveness of the learned statistics over both controlled data sources and in the context of BibFinder with autonomous online sources.

Published in:

Knowledge and Data Engineering, IEEE Transactions on  (Volume:17 ,  Issue: 5 )

Date of Publication:

May 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.