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Proceedings. 6th international symposium on quality electronic design

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The following topics are dealt with: tools and flows for quality design; high level power/noise reduction techniques; leakage and dynamic power issues; test application and cost reduction; DFM and physical layout; performance and reliability analysis for yield optimization; functional verification and test generation; power delivery and distribution; quality system level design and synthesis; DFM for circuit design; leakage and reliability management; analog test and BIST; nanoelectronics: evolution or revolution; design methods and tools in DSM; design techniques for leakage reduction; variability issues in nanoscale circuits; issues in noise and timing; design approaches for system in package (SIP); DSM interconnect issues; advances in floorplanning; issues in on-chip communication and analog/RF designs; and robust design under parameter variations.

Published in:

Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on

Date of Conference:

21-23 March 2005

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