Cart (Loading....) | Create Account
Close category search window

Proceedings. 6th international symposium on quality electronic design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.

The following topics are dealt with: tools and flows for quality design; high level power/noise reduction techniques; leakage and dynamic power issues; test application and cost reduction; DFM and physical layout; performance and reliability analysis for yield optimization; functional verification and test generation; power delivery and distribution; quality system level design and synthesis; DFM for circuit design; leakage and reliability management; analog test and BIST; nanoelectronics: evolution or revolution; design methods and tools in DSM; design techniques for leakage reduction; variability issues in nanoscale circuits; issues in noise and timing; design approaches for system in package (SIP); DSM interconnect issues; advances in floorplanning; issues in on-chip communication and analog/RF designs; and robust design under parameter variations.

Published in:

Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on

Date of Conference:

21-23 March 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.