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IEC flickermeter response to interharmonic pollution

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4 Author(s)
Gallo, D. ; Dipt. di Ingegneria dell''informazione, Seconda Universita di Napoli, Aversa, Italy ; Landi, C. ; Langella, Roberto ; Testa, Alfredo

The paper discusses the response of flickermeters to interharmonic voltage pollution from theoretical and experimental points of view. Light flicker can be caused by interharmonics because these components are able to introduce fluctuations both in rms and peak value of supply voltage. The IEC standard flickermeter was deigned, for historical reasons, only with reference to amplitude voltage modulation that is the first source of light flicker identified. Nevertheless, the instrument was expected to properly work and measure also the effects of interharmonics. The paper presents a test system able to perform the advanced calibration and performance verification of flickermeter also with reference to interharmonic pollution. The experimental results obtained testing a commercial instrument are shown and discussed.

Published in:

Harmonics and Quality of Power, 2004. 11th International Conference on

Date of Conference:

12-15 Sept. 2004