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Fault diagnosis of a GHz CMOS LNA using high-speed ADC-based BIST

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2 Author(s)
J. Liobe ; Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA ; M. Margala

This paper presents a fault isolation method using the digital signatures from a LNA BIST solution. The fault localization capabilities of the functional test and data analysis methods are demonstrated by circuit level simulation. Also a discussion of the efficacy of this method is given. Results showed that only 16% of the resistive faults examined here cannot be mapped to its specification location in the LNA.

Published in:

Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on

Date of Conference:

25 April 2004