Cart (Loading....) | Create Account
Close category search window
 

Optical frequency measurements using fs-comb generators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Schnatz, H. ; Phys. Tech. Bundesanstalt, Braunschweig, Germany ; Lipphardt, B. ; Degenhardt, C. ; Peik, E.
more authors

We have used a Ti:Sapphire-based fs-comb generator to measure the frequencies of several optical frequency standards available at PTB. The frequency values for HeNe- and frequency-doubled Nd:Yag lasers stabilized to iodine hyperfine transitions as well as the frequencies of the 1S0-3P1 transition of 40Ca at 657.5 nm (456 THz) and the 2S12/-2D32/ transition of 171Yb+ at 435.5 nm (688 THz) are presented. Comparing our results with previously published data for the frequency variation of transitions of the Hg+ ion and H atom, we have derived a new upper limit of the variation of the fine structure constant α.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:54 ,  Issue: 2 )

Date of Publication:

April 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.