Referenced Items are not available for this document.
We present a rigorous two-step analysis of systematic errors in the four-noise parameter determination of a two-port network using the cold-source technique. This analysis is based on an original model that accounts for residual errors in the source impedance measurement. The method employs two linear fractional transforms to decompose the errors into relevant factor sets affecting the parameters in different ways. Analyses performed for a low-noise pseudomorphic high-electron mobility transistor (PHEMT) and a microwave amplifier show that the noise parameters of the low-noise PHEMT are highly vulnerable to such errors.
Published in:
Instrumentation and Measurement, IEEE Transactions on
(Volume:54
,
Issue:
2
)
Date of Publication: April 2005
- Page(s):
- 696 - 700
- ISSN :
- 0018-9456
- INSPEC Accession Number:
- 8430636
- Digital Object Identifier :
- 10.1109/TIM.2005.843534
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 21 March 2005
- Issue Date :
- April 2005
- Sponsored by :
- IEEE Instrumentation and Measurement Society
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
