Scheduled System Maintenance:
On Wednesday, July 29th, IEEE Xplore will undergo scheduled maintenance from 7:00-9:00 AM ET (11:00-13:00 UTC). During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Systematic errors of noise parameter determination caused by imperfect source impedance measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wiatr, Wojciech ; Warsaw Univ. of Technol., Poland ; Walker, D.K.

We present a rigorous two-step analysis of systematic errors in the four-noise parameter determination of a two-port network using the cold-source technique. This analysis is based on an original model that accounts for residual errors in the source impedance measurement. The method employs two linear fractional transforms to decompose the errors into relevant factor sets affecting the parameters in different ways. Analyses performed for a low-noise pseudomorphic high-electron mobility transistor (PHEMT) and a microwave amplifier show that the noise parameters of the low-noise PHEMT are highly vulnerable to such errors.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:54 ,  Issue: 2 )