By Topic

Characterization and parasitic extraction of EMI filters using scattering parameters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shuo Wang ; Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA ; Lee, F.C. ; Odendaal, W.G.

In this paper, the electromagnetic interference (EMI) filter is first characterized using Scattering parameters (S-parameters). Based on this S-parameters model, the insertion voltage gains are derived for EMI filter with arbitrary levels of source and load impedances. Experiments are carried out to verify this approach. Based on the network theory, S-parameters are then utilized to extract the parasitic couplings in both one-stage and two-stage EMI filters. EMI filter models are constructed. Experiments finally verify the proposed methods. The approaches are very useful for the prediction of EMI filter performance, and for the design and optimization of EMI filters.

Published in:

Power Electronics, IEEE Transactions on  (Volume:20 ,  Issue: 2 )