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Online BIST and BIST-based diagnosis of FPGA logic blocks

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3 Author(s)
Abramovici, M. ; Design Autom. for Flexible Chip Architectures, Framingham, MA, USA ; Stroud, C.E. ; Emmert, J.M.

We present the first online built-in self-test (BIST) and BIST-based diagnosis of programmable logic resources in field-programmable gate arrays (FPGAs). These techniques were implemented and used in a roving self-testing areas (STARs) approach to testing and reconfiguration of FPGAs for fault-tolerant applications. The BIST approach provides complete testing of the programmable logic blocks (PLBs) in the FPGA during normal system operation. The BIST-based diagnosis can identify any group of faulty PLBs, then applies additional diagnostic configurations to identify the faulty look-up table or flip-flop within a faulty PLB. The ability to locate defective modules inside a PLB enables a new form of fault-tolerance that reuses partially defective PLBs in their fault-free modes of operation.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:12 ,  Issue: 12 )

Date of Publication:

Dec. 2004

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