Close category search window
 

A viscous-type dynamic hysteresis model as a tool for loss separation in conducting ferromagnetic laminations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zirka, S.E. ; Dept. of Appl. Phys. & Technol., Dnepropetrovsk Nat. Univ., Ukraine ; Moroz, Y.I. ; Marketos, P. ; Moses, A.J.

A viscous-type dynamic hysteresis model (DHM) that is compatible with any static hysteresis model is described. In contrast to existing dynamic models, the DHM is characterized by fixed desired properties over an infinite frequency range and provides the possibility of changing the shape of the steady-state hysteresis loop. The way the DHM is combined with Maxwell equations makes it possible for the first time to separate all three components of the total loss in conducting ferromagnetic laminations. These are the static hysteresis loss, classical eddy-current loss, and the excess loss treated as a dynamic hysteresis component. The study of their frequency dependencies opens a possibility of accurate iron loss prediction based on the loss separation principle.

Published in:
Magnetics, IEEE Transactions on  (Volume:41 ,  Issue: 3 )

Date of Publication: March 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.