Cart (Loading....) | Create Account
Close category search window
 

An embedding debugging architecture for SOCs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

Multiple cores embedded debugging architecture for system on chip design (SOC) is presented. It presents an asymmetrical functional test problem. To analyze the problem and optimize performance in multicore operation, debug tools with interfaces are exercised for several cores. HyperJTAG (joint test action group) interface reduces the IO pin interfaces required for debugging several cores. To overcome the wiring problem in hyperJTAG, wire routing and debugging synchronization is proposed. Hyper debug action nodes at each core initiate global or local control actions that synchronously reset the cores. To provide a virtual connection between the processor core in the SoC and its corresponding probe control, MED (multicore embedded debugging) software tool is proposed. This allows a contiguous analysis flow from the system level simulation models of SoC systems through FPGA and emulation prototyping and finally it debug the silicon hardware.

Published in:

Potentials, IEEE  (Volume:24 ,  Issue: 1 )

Date of Publication:

Feb.-March 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.