Cart (Loading....) | Create Account
Close category search window
 

Parameter Estimation by Descent and Genetic Algorithm Methods of an In-Vitro Stenosis Bypass Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Woo, T. ; Department of Electrical and Computer Engineering, The University of Texas at El Paso, El Paso, TX 79968, USA ; Palafox, G. ; Diong, B. ; Wicker, R.

The development of improved hemodynamic impedance models can greatly aid the understanding of arterial disease progression and its remediation. This paper leverages the recent progress in advanced manufacturing techniques to engage in in-vitro experimentation with physiologically relevant geometries and flows that correspond to arterial stenosis. The measurements of pressures and flow obtained by these experiments were then used to estimate flow-to-pressure transfer functions, aimed at determining a lumped-parameter impedance model of the physical system, by applying conventional descent as well as recently developed Genetic Algorithm methods. The resulting transfer functions can now be utilized for further studies with regard to the hemodynamics relevant to arterial stenosis.

Published in:

Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE  (Volume:2 )

Date of Conference:

1-5 Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.