Cart (Loading....) | Create Account
Close category search window
 

A unified approach for lesion segmentation on MRI of multiple sclerosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sajja, B.R. ; Dept. of Radiol., Texas Univ., Houston, TX, USA ; Datta, S. ; He, R. ; Narayana, P.A.

Accurate determination of lesion volumes on brain MR images is hampered by the presence of a large number of false positive and negative classifications. A strategy that combines parametric and nonparametric techniques is developed and implemented for minimizing the false classifications. Initially, CSF and lesions are segmented using Parzen window classifier. Image processing, morphological operations, and ratio map of proton density (PD) and T2 weighted images are used for minimizing false positives. Lesions are delineated using fuzzy connectedness principle. Contextual information was used for minimizing false negative lesion classifications. Gray and white matter classification is realized using HMRF-EM algorithm.

Published in:

Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE  (Volume:1 )

Date of Conference:

1-5 Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.