Cart (Loading....) | Create Account
Close category search window

Lognormal and Weibull accelerated life test plans under distribution misspecification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pascual, F.G. ; Dept. of Math., Washington State Univ., Pullman, WA, USA ; Montepiedra, G.

In this article, we derive expressions for the asymptotic distribution of maximum likelihood estimators of model parameters in accelerated life tests (ALTs) when the model distribution is misspecified. We investigate results for two popular models, namely, the lognormal and Weibull Arrhenius-type ALT models. We propose test plan criteria based on asymptotic bias (ABias) and asymptotic mean squared error (AMSE) to derive ALT test plans. We derive 4:2:1 allocation plans that minimize either ABias2 or AMSE. These criteria provide control over estimation bias and variance when the model distribution is misspecified.

Published in:

Reliability, IEEE Transactions on  (Volume:54 ,  Issue: 1 )

Date of Publication:

March 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.