By Topic

Lognormal and Weibull accelerated life test plans under distribution misspecification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pascual, F.G. ; Dept. of Math., Washington State Univ., Pullman, WA, USA ; Montepiedra, G.

In this article, we derive expressions for the asymptotic distribution of maximum likelihood estimators of model parameters in accelerated life tests (ALTs) when the model distribution is misspecified. We investigate results for two popular models, namely, the lognormal and Weibull Arrhenius-type ALT models. We propose test plan criteria based on asymptotic bias (ABias) and asymptotic mean squared error (AMSE) to derive ALT test plans. We derive 4:2:1 allocation plans that minimize either ABias2 or AMSE. These criteria provide control over estimation bias and variance when the model distribution is misspecified.

Published in:

Reliability, IEEE Transactions on  (Volume:54 ,  Issue: 1 )