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Thermal investigation of high power Optical Devices by transient testing

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4 Author(s)

In case of opto-electronic devices, the power applied on the device leaves in a parallel heat and light transport, the interpretation of Rth is not obvious. The paper shows results of a combined optical and thermal measurement for the characterization of power light emitting diodes (LEDs). A model explaining Rth changes at different current levels is proposed.

Published in:

Components and Packaging Technologies, IEEE Transactions on  (Volume:28 ,  Issue: 1 )

Date of Publication:

March 2005

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