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Robust system design with built-in soft-error resilience

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5 Author(s)

Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.

Published in:

Computer  (Volume:38 ,  Issue: 2 )