Cart (Loading....) | Create Account
Close category search window
 

Model-based tracking of 3D objects based on a sequential Monte-Carlo method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Noyer, J.C. ; Lab. d''Analyse des Syst. du Littoral, Univ. du Littoral Cote d''Opale, Calais, France ; Lanvin, P. ; Benjelloun, M.

One details here a method to track a 3D object and estimate its 3D position and motion parameters from a monocular image sequence. This estimation problem is modeled by state equations that describe the dynamics of the object and the measurement delivered by the sensor. One develops a top-down approach that needs a point description of the shape to track. This allows a direct comparison with the pixels in the image without any preprocessing that may give rise to additional errors. The proposed method also delivers an estimation of the dense 3D motion vector field and, by projection onto the image plane, of the 2D motion field that can be compared with the optical flow methods.

Published in:

Signals, Systems and Computers, 2004. Conference Record of the Thirty-Eighth Asilomar Conference on  (Volume:2 )

Date of Conference:

7-10 Nov. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.