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Capacitive coupling noise in high-speed VLSI circuits

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2 Author(s)
P. Heydari ; Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA ; M. Pedram

Rapid technology scaling along with the continuous increase in the operation frequency cause the crosstalk noise to become a major source of performance degradation in high-speed integrated circuits. This paper presents an efficient metric to estimate the capacitive crosstalk in nanometer high-speed very large scale integration circuits. In particular, we provide closed-form expressions for the peak amplitude, the pulsewidth, and the time-domain waveform of the crosstalk noise. Experimental results show that the maximum error of our noise predictions is less than 13%, while the average error is only 5.82%.

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:24 ,  Issue: 3 )