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Browse Journals & Magazines > Electromagnetic Compatibility ...> Volume:47 Issue:1 Help

Investigations on the correlation between IC-conducted emission and chip-level power supply current

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2 Author(s)
Fiori, F. ; Dept. of Electr. Eng., Politecnico di Torino, Italy ; Musolino, F.

This work deals with the control by design of digital integrated circuits conducted emission. In particular, it describes a technique to correlate the conducted emission of a digital integrated circuit (IC) with the power supply currents absorbed by its building blocks. Such a correlation allows one to derive the maximum allowable limits of current spectra at chip level in order to fulfill IC-conducted emission specifications.

Published in:
Electromagnetic Compatibility, IEEE Transactions on  (Volume:47 ,  Issue: 1 )

Date of Publication: Feb. 2005

Page(s):
28 - 33
ISSN :
0018-9375
INSPEC Accession Number:
8319410
Digital Object Identifier :
10.1109/TEMC.2004.842203
Product Type:
Journals & Magazines
Date of Current Version :
22 February 2005
Issue Date :
Feb. 2005
Sponsored by :
IEEE Electromagnetic Compatibility Society

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