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This work deals with the control by design of digital integrated circuits conducted emission. In particular, it describes a technique to correlate the conducted emission of a digital integrated circuit (IC) with the power supply currents absorbed by its building blocks. Such a correlation allows one to derive the maximum allowable limits of current spectra at chip level in order to fulfill IC-conducted emission specifications.
Electromagnetic Compatibility, IEEE Transactions on (Volume:47 , Issue: 1 )
Date of Publication: Feb. 2005