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Smart temperature sensor for thermal testing of cell-based ICs

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4 Author(s)
S. A. Bota ; Grup de Tecnologia Electronica, Univ. de les Illes Baleares, Palma de Mallorca, Spain ; M. Rosales ; J. L. Rossello ; J. Segura

In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity. Simulation results from a 0.18-μm CMOS technology show that the nonlinearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.

Published in:

Design, Automation and Test in Europe

Date of Conference:

7-11 March 2005