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Dielectric constant, loss tangent, and surface resistance of PCB materials at K-band frequencies

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7 Author(s)
Egorov, V.N. ; East-Siberian Res. Inst. of Physico-Tech. & Radioengineering Meas.s, Irkutsk ; Masalov, V.L. ; Nefyodov, Y.A. ; Shevchun, A.F.
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This paper develops the theoretical approach and describes the design of a practical test rig for measuring the microwave parameters of unclad and laminated dielectric substrates. The test rig is based on a sapphire whispering-gallery resonator and allows the measurement of the following parameters: dielectric constant (epsiv) of the dielectric substrate in the range from 2 to 10, loss tangent (tandelta) of the dielectric substrate in the range from 10-4 to 10-2, and microwave losses of copper coating of the substrate in the range from 0.03 to 0.3 Omega. Measurements of numerous commonly used microwave printed-circuit-board materials were performed at frequencies between 30-40 GHz and over a temperature range of -50degC to +70degC

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:53 ,  Issue: 2 )