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Nanomanipulation with 3D visual and force feedback using atomic force microscopes

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3 Author(s)
W. Vogl ; Technische Univ. Munchen, Garching, Germany ; M. Sitti ; M. F. Zah

Atomic force microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.

Published in:

Nanotechnology, 2004. 4th IEEE Conference on

Date of Conference:

16-19 Aug. 2004