By Topic

On single electron technology full adders

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sulieman, M. ; Sch. of EE&CS, Washington State Univ., Pullman, WA, USA ; Beiu, V.

This paper reviews several full adder (FA) designs in single electron technology (SET). In addition to the structure and size already reported for these SET FAs, this paper provides a quantitative and qualitative comparison in terms of delay, power dissipation, and sensitivity to (process) variations - for the first time. This can allow for a better understanding of the advantages and disadvantages of each solution. A new SET FA design, based on capacitive SET threshold logic gates, is described and compared with the other SET FAs.

Published in:

Nanotechnology, 2004. 4th IEEE Conference on

Date of Conference:

16-19 Aug. 2004