Cart (Loading....) | Create Account
Close category search window

Error rate measurements of a Josephson single flux quantum binary ripple counter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Durand, D.J. ; TRW Space & Technol. Group. Redondo Beach, CA, USA ; Sandell, R.D. ; Heflinger, L. ; Silver, A.H.

Single-flux quantum devices are used in superconductive analog-to-digital converters (ADCs), shift registers, and memory cells. They have been proposed for logic applications. The authors report the performance of high-speed superconducting, single-flux quantum (SFQ) ripple counters. Both memory and logic functions of the counter are investigated. Errors in logic operation produce bit error rates (BERs) as low as 0.22 errors per million binary operations, measured while counting 100-MHz pseudorandom input pulses. Errors in memory function do not occur on the time scale of the measurements. The BER is shown to be nearly independent of input bit rate and pattern, but strongly dependent on the counter cell operating point.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:2 ,  Issue: 2 )

Date of Publication:

June 1992

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.